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SECONDARY ELECTRON EMISSION FROM URANIUM SURFACE DUE TO BOMBARDMENT BY HIGH-ENERGY IONSHAO LIN CHEN; SOLARZ R; ERBERT G et al.1983; APPLIED PHYSICS LETTERS; ISSN 0003-6951; USA; DA. 1983; VOL. 42; NO 1; PP. 120-121; BIBL. 5 REF.Article

SECONDARY EMISSION FROM MULTIALKALI PHOTOCATHODESGHOSH G; VARMA BP.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 8; PP. 4554-4555; BIBL. 13 REF.Article

INJECTION MECHANISM FOR TRANSMISSION SECONDARY EMISSION FROM POROUS KCL FILMS.ITO H; YOSHIDA S.1977; JAP. J. APPL. PHYS.; JAP.; DA. 1977; VOL. 16; NO 12; PP. 2151-2155; BIBL. 6 REF.Article

FINITE ELEMENT INVESTIGATION OF THE CONDITIONS FOR SECONDARY TWINNING IN X-CUT ALPHA -QUARTZBERTAGNOLLI E; KITTINGER E; SWOBODA G et al.1981; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1981; VOL. 14; NO 2; PP. 251-260; BIBL. 16 REF.Article

A LOW-MATTER BEAM PROFILE SECONDARY EMISSION MONITORANNE R; LEFOL A; MILLERET G et al.1978; NUCL. INSTRUM. METHODS; NLD; DA. 1978; VOL. 152; NO 2-3; PP. 395-398; BIBL. 3 REF.Article

DETERMINATION THEORIQUE DE L'EFFICACITE DES ELECTRONS RETRODIFFUSES DANS L'EMISSION ELECTRONIQUE SECONDAIRE DE L'ALUMINIUMBINDI R; LANTERI H; ROSTAING P et al.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 12; PP. 2351-2361; ABS. ENG; BIBL. 21 REF.Article

DISTINCTION ET RELATION ENTRE RAYONNEMENT DE PARTICULES CANALISEES ET RAYONNEMENT DE FREINAGE COHERENTBELOSHITSKIJ VV; KUMAKHOV MA.1980; DOKL. AKAD. NAUK SSSR; ISSN 0002-3264; SUN; DA. 1980; VOL. 251; NO 2; PP. 331-335; BIBL. 12 REF.Article

CREATION ENERGIES FOR SECONDARY ELECTRONSFITTING HJ; GLAEFEKE H; WILD W et al.1979; KRISTALL U. TECH.; DDR; DA. 1979; VOL. 14; NO 3; PP. K13-K17; BIBL. 8 REF.Article

DIRECT AND RECOIL-INDUCED ELECTRON EMISSION FROM ION-BOMBARDED SOLIDSHOLMEN G; SVENSSON B; SCHOU J et al.1979; PHYS. REV., B; USA; DA. 1979; VOL. 20; NO 6; PP. 2247-2254; BIBL. 29 REF.Article

HIGH-EFFICIENCY SECONDARY ELECTRON EMISSION PRODUCED BY IONS INCIDENT ON A POROUS MGO-AG LAYER.KOSHIDA N; YOSHIDA S.1978; APPL. PHYS. LETTERS; U.S.A.; DA. 1978; VOL. 32; NO 11; PP. 708-710; BIBL. 3 REF.Article

SPACE-CHARGE LIMITATION OF SECONDARY ELECTRON EMISSIONMALAT V; HORACEK J.1978; CZECHOSL. J. PHYS.; CSK; DA. 1978; VOL. B28; NO 11; PP. 1246-1259; BIBL. 3 REF.Article

EMISSION SECONDAIRE POUR DE FAIBLES VALEURS DE L'ENERGIE DES ELECTRONS PRIMAIRESBAKAEV AV; BORISOV VL; LEPESHINSKAYA VN et al.1978; RADIOTEKH. I ELEKTRON.; S.S.S.R.; DA. 1978; VOL. 23; NO 2; PP. 403-406; BIBL. 10 REF.Article

EXOELECTRON EMISSION DUE TO RELAXATION PROCESSES AT SURFACESFITTING HJ.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1981; VOL. 63; NO 1; PP. K47-K50; BIBL. 12 REF.Article

ENERGY- AND ANGULAR-DEPENDENT SECONDARY-ELECTRON EMISSION FROM A SILICON (111) 7 X 7 SURFACE. II: EMISSION FROM SURFACE-STATE RESONANCESBEST PE.1979; PHYS. REV., B; USA; DA. 1979; VOL. 19; NO 4; PP. 2246-2249; BIBL. 12 REF.Article

PARTICLE DETECTION BY MEANS OF CONTROLLABLE SECONDARY ELECTRON EMISSION METHOD.LORIKYAN MP; TROFIMCHUK NN.1977; NUCL. INSTRUM. METHODS; NETHERL.; DA. 1977; VOL. 140; NO 3; PP. 505-509; BIBL. 13 REF.Article

ION INDUCED SECONDARY ELECTRON EMISSION FROM SINGLE CRYSTAL SURFACESVON GEMMINGEN U.1982; SURF. SCI.; ISSN 0039-6028; NLD; DA. 1982; VOL. 120; NO 2; PP. 334-346; BIBL. 20 REF.Article

MISE AU POINT DE DETECTEURS A EMISSION SECONDAIRE = DEVELOPMENT OF SECONDARY EMISSION DETECTORSJANOUIN SERGE.1981; ; FRA; DA. 1981; 80 P.; 30 CM; BIBL. 58 REF.; TH. 3E CYCLE: PHYS. NUCL./PARIS 11/1981/3112Thesis

CALCUL DE L'EFFICACITE DES ELECTRONS INELASTIQUEMENT REFLECHIS EN CAS D'ACTIVATION EN SURFACE PAR FAISCEAU ELECTRONIQUEMORDVINTSEV VM; VISHNYAKOV BA.1980; FIZ. HIM., OBRAB. MATER.; ISSN 0015-3214; SUN; DA. 1980; VOL. 5; PP. 25-30; BIBL. 11 REF.Article

RELATION ENTRE L'ENERGIE MOYENNE DES ELECTRONS SECONDAIRES DANS LES HYDROCARBURES SOLIDES ET L'ENERGIE D'EXCITATIONS EN SINGULETBUBNOV L YA; FRANKEVICH EL.1978; KHIM. VYS. ENERG.; S.S.S.R.; DA. 1978; VOL. 12; NO 1; PP. 78-80; BIBL. 9 REF.Article

MEASUREMENT OF THE STATISTICS OF TRANSMISSION SECONDARY EMISSION FROM NEGATIVE-ELECTRON-AFFINITY SILICON.LING YS; THUMWOOD RF.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 5; PP. 535-537; BIBL. 9 REF.Article

A NEW APPROACH AND RESOLUTION METHOD OF THE BOLTZMANN EQUATION APPLIED TO SECONDARY ELECTRON EMISSION, BY REFLECTION FROM POLYCRISTALLINE ALUMINIUMBINDI R; LANTERI H; ROSTAING P et al.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 2; PP. 267-280; BIBL. 40 REF.Article

AN ANALYSIS OF SCATTERING PROCESSES OF CONVERSION ELECTRONS IN SOLID LAYERSPROYKOVA A.1980; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 2; PP. 291-305; BIBL. 22 REF.Article

AN EXPERIMENTAL ASSESSMENT OF PROPOSED UNIVERSAL YIELD CURVES FOR SECONDARY ELECTRON EMISSIONSALEHI M; FLINN EA.1980; J. PHYS. D.; ISSN 0022-3727; GBR; DA. 1980; VOL. 13; NO 2; PP. 281-289; BIBL. 24 REF.Article

THE CONTRIBUTION OF INTERNAL ELECTRON SOURCES TO TSEE TRAP POPULATIONSCHARMANN A; WIESSLER U.1979; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1979; VOL. 55; NO 1; PP. K117-K118; BIBL. 5 REF.Article

COMPACT MULTI-SPECIMEN CLEAVAGE AND ROTATION MECHANISM FOR SECONDARY-EMISSION STUDIES.SALEHI M; FLINN EA.1978; J. PHYS. E; G.B.; DA. 1978; VOL. 11; NO 3; PP. 234-236; BIBL. 1 REF.Article

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